4. Data processing: structural design, modeling, simulation, and em
  5. Simulating electronic device or electrical system
  6. Circuit simulation

Kailasnath S. Maneparambil

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Enabling at speed application of test patterns associated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for scan design using a formal...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2770660

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