4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Specific identifiable device, circuit, or system
  6. Fusible link or intentional destruct circuit

Jun-Keun Lee

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Antifuse programming circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate

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Semiconductor memory device with reduced package test time

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2117746

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