Antifuse programming circuit

Details Antifuse programming circuit Antifuse programming circuit

2000-12-19

2001-12-25

Ton, My-Trang Nu (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific identifiable device, circuit, or system

Fusible link or intentional destruct circuit

Reexamination Certificate

active

06333667

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to a semiconductor device; and, more particularly, to an antifuse programming circuit for performing a programming operation without causing any stress to an antifuse element.
DESCRIPTION OF THE PRIOR ART
In
FIG. 1
, there is shown a schematic diagram of a conventional antifuse programming circuit.
The conventional antifuse programming circuit
10
includes a program signal generator
11
, an antifuse element
12
and a diode-connected NMOS transistor
13
. The program signal generator
11
provides a negative voltage signal used for programming the antifuse element
12
. In an unprogrammed state, a node N between the antifuse element
12
and the diode-connected NMOS transistor
13
is set to a floating state.
When the negative voltage signal is provided to the node N, a voltage difference between two terminals of the antifuse element
12
is greatly large so that an insulating material used to form the antifuse element
12
is broken down. In the floating state, a negative threshold voltage, i.e., −Vt, is provided to the node N. Thus, the voltage difference between both terminals of the antifuse element
12
becomes very small, so that the insulating material is not broken down.
However, a successive stress is caused to the antifuse element
12
due to the negative threshold voltage. As a result, there is a problem that a life span of the antifuse element
12
is shortened.
SUMMARY OF THE INVENTION
It is, therefore, an object of the present invention to provide an antifuse programming circuit for performing a programming operation without causing any stress to an antifuse element.
In accordance with an aspect of the present invention, there is provided an antifuse programming circuit, comprising: an antifuse element, the antifuse element being programmable according to a voltage difference between both terminals thereof; a control logic means for generating a control signal in response to internal address signals and an external address signal; a negative voltage generation means, coupled to the antifuse element, for generating a negative voltage signal; and a power connection control means, in response to the control signal, for coupling the negative voltage signal to a ground terminal when the antifuse element is in an unprogrammed state.


REFERENCES:
patent: 5793224 (1998-08-01), Sher
patent: 6054893 (2000-04-01), Singh
patent: 6144247 (2000-11-01), Kim et al.
patent: 6150868 (2000-11-01), Kim et al.
patent: 6240033 (2001-05-01), Yang et al.
patent: 6246623 (2001-06-01), Ingalls

Affiliated with

Also associated with

Rating

Antifuse programming circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Antifuse programming circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Antifuse programming circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2564859