Static information storage and retrieval
Addressing
Plural blocks or banks
Inventor
active
Dual edge-triggered flip-flop design with asynchronous...
Memory array with common word line
Method for scan testing and clocking dynamic domino circuits...
Scanable R-S glitch latch for dynamic circuits
System and method for automatic generation of an at-speed...
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Profile ID: LFUS-PAI-P-2600180