4. Electric heating
  5. Microwave heating

Joseph J. Van Horn

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Method and apparatus for stressing, burning in and reducing leak

Electric heating – Microwave heating
Patent

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Segmented architecture for wafer test and burn-in

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Temporary device attach structure for test and burn in of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1809582

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