4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Jorge L. de Varona

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Bumped semiconductor component having test pads, and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Method and system having switching network for testing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and system having switching network for testing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for testing bumped semiconductor components

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Semiconductor component having test contacts

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2493396

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