4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Fluorescence

Jordan Valley Applied Radiation Ltd.

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Beam centering and angle calibration for X-ray reflectometry

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Combined X-ray reflectometer and diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Contamination and residuals inspection system

Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
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Detection of dishing and tilting using X-ray fluorescence

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Detection of voids in semiconductor wafer processing

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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