4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jong-bok Tcho

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Memory devices with selectively enabled output circuits for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Test method for high speed memory devices in which limit...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2050889

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