4. Electricity: measuring and testing
  5. Plural, automatically sequential tests

John Zasio

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Module and method for interconnecting integrated circuits...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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System and method for calibrating electron beam systems

Radiant energy – Means to align or position an object relative to a source or...
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Test fixture for providing electrical access to each I/O pin of

Electricity: measuring and testing – Plural – automatically sequential tests
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Wafer-level burn-in

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-928255

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