4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

John Memishian

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Feedback circuit for micromachined accelerometer

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate

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Feedback circuit for micromachined accelerometer

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate

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Multiple axis acceleration sensor

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate

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Offset trimming for a micromachined sensing device

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Amplitude control
Patent

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Reset switch for a micromachined device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Profile ID: LFUS-PAI-P-134157

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