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John M. Cohn

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Circuit and method for monitoring defects

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit layout methodology using a shape processing application

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Circuit layout methodology using via shape process

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Contextual based groundrule compensation method of mask data...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Defect diagnosis for semiconductor integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Profile ID: LFUS-PAI-P-1721349

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