4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

John K. Schwartzlow

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Method and circuit for data dependent voltage bias level

Coded data generation or conversion – Analog to or from digital conversion – Digital to analog conversion
Patent

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Parallel access testing of a memory array

Static information storage and retrieval – Read/write circuit – Testing
Patent

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System for data dependent voltage bias level

Coded data generation or conversion – Converter compensation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1482478

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