4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

John E. Bertsch

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Fabrication test circuit and method for signalling out-of-spec r

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method and system for including parametric in-line test data...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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Offset corrected amplifier

Amplifiers – With periodic switching input-output
Patent

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Profile ID: LFUS-PAI-P-519358

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