4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

John Blake Pavelka

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Apparatus and method for non-destructive inspection and/or measu

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and apparatus for automatic frequency and voltage selecti

Boots – shoes – and leggings
Patent

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RF power amplifier and method for packaging the same

Amplifiers – With semiconductor amplifying device – Integrated circuits
Reexamination Certificate

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RF power amplifier and method for packaging the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1528350

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