Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1992-12-22
1998-04-28
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356371, G01N 2117
Patent
active
057452385
ABSTRACT:
The present invention relates generally to a new apparatus and a method for non-destructive inspection and/or measurement. And, more particularly, the invention encompasses an apparatus that has a flexible foil or membrane secured thereto which conforms to the surface of the part that is being inspected and/or measured in a nondestructive manner using differential pressure.
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Long David Clifford
Pavelka John Blake
Stroms Karl Friedrich
Weiss, deceased Gerhard
Ahsan Aziz M.
International Business Machines - Corporation
Pham Hoa Q.
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