4. Facsimile and static presentation processing
  5. Facsimile
  6. Recording apparatus

Joel L. Seligson

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Apparatus and methods for determining overlay and uses of same

Optics: measuring and testing – By configuration comparison
Reexamination Certificate

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Apparatus and methods for determining overlay and uses of same

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

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Autofocusing apparatus and method for high resolution...

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems
Reexamination Certificate

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Continuously varying offset mark and methods of determining...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Imaging apparatus

Facsimile and static presentation processing – Facsimile – Recording apparatus
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Profile ID: LFUS-PAI-P-1422621

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