4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Jianhong Zhu

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Method and system for characterizing porous materials

Coating processes – Measuring – testing – or indicating
Reexamination Certificate

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Method and system for characterizing porous materials

Coating processes – Measuring – testing – or indicating
Reexamination Certificate

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Method and system for treating a dielectric film

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of...
Reexamination Certificate

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Method for treating a dielectric film

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

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MOS structures with remote contacts and methods for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2393822

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