4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Ji-Fu Chen

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Method of testing for SRAM pull-down transistor sub-threshold le

Static information storage and retrieval – Read/write circuit – Testing
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SRAM for SNM measurement

Static information storage and retrieval – Systems using particular element – Flip-flop
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Profile ID: LFUS-PAI-P-1255211

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