4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Specific identifiable device, circuit, or system
  6. With specific source of supply or bias voltage

Jens Haetty

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Internal reference voltage generation for integrated circuit...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate

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Method and apparatus for semiconductor testing utilizing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Test data topology write to memory using latched sense...

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3024933

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