Method and apparatus for semiconductor testing utilizing...

Details Method and apparatus for semiconductor testing utilizing... Method and apparatus for semiconductor testing utilizing...

2007-08-21

2007-08-21

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S765010

Reexamination Certificate

active

11060737

ABSTRACT:
A method and apparatus for testing semiconductor wafers in which certain contact areas of dies not used in the testing and required to be at a predetermined voltage during testing are connected to the predetermined voltage via an integrated circuit in the die.

REFERENCES:
patent: 6401224 (2002-06-01), Schoniger et al.
patent: 6734695 (2004-05-01), Schaffroth et al.
patent: 6744271 (2004-06-01), Baker
patent: 7034559 (2006-04-01), Frankowsky et al.
patent: 7054222 (2006-05-01), Li et al.
patent: 2005/0110511 (2005-05-01), Gabara et al.

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