X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Attorney
active
No affiliations
Apparatus and method for suppressing insignificant...
Diagnosing system for an x-ray source assembly
In-situ X-ray diffraction system using sources and detectors...
Method and apparatus for implement XANES analysis
Method and device for cooling and electrically insulating a...
LandOfFree
Jeffrey R. Klembczyk, Esq. does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Jeffrey R. Klembczyk, Esq., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jeffrey R. Klembczyk, Esq. will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2849839