4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Having predetermined light transmission regions

Jeffrey M. Solomon

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Computer controlled, multiple angle illumination system

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Method and system for displaying VLSI layout data

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and system for displaying VLSI layout data

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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