Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1991-04-26
1993-02-09
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
25022729, 356446, 356340, 362 32, 362 33, G01N 2188, G01N 2147, F21V 800, F21V 3300
Patent
active
051856387
ABSTRACT:
The illumination system as a part of an optical inspection system, the total inspection system itself, and the method of illuminating and inspecting a workpiece. The illumination system is computer controlled as to a level of intensity and adjustable as to angle of incidence. The illumination system includes illumination control electronics, a quad quartz halogen lamp array light source, a fiber optic line converter and an illumination collection system, having a collimator lens array and a focusing/field coverage lens. As a result of the present invention, determinations of false defects on the PCB are minimized. Human contact with the PCB is also minimized and the rate of inspections performable is increased.
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Conzola Vincent C.
Rittenhouse Norman E.
Solomon Jeffrey M.
Toomey Thomas J.
Yablonsky Peter J.
Goldman Richard M.
International Business Machines - Corporation
McGraw Vincent P.
Olsen Judith D.
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