4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Jeanne Trinko-Mechler

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Automated simulation testbench generation for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method, system and program product for building an automated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Scan-bypass architecture without additional external latches

Excavating
Patent

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Scan-bypass architecture without additional external latches

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Profile ID: LFUS-PAI-P-1388474

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