Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-12-05
2008-10-28
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S123000, C703S014000, C370S248000
Reexamination Certificate
active
07444258
ABSTRACT:
Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are adaptable to arbitrary configurations of the datapath system. The database is provided with a single set of transactors per core. Next, the method automatically selects one set of transactors from the database for inclusion into the simulation testbenches. Following this, the method maps the first datapath and the second datapath through the datapath system by interconnecting the selected set of the transactors with the datapath system. The method further comprises setting control pins on the cores to facilitate propagation of the data through the cores of the datapath system. Subsequently, the control pins are traced to input ports and control registers.
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Kampf Francis A.
Stauffer David R.
Trinko-Mechler Jeanne
Baran Mary C
Gibb & Rahman, LLC
International Business Machines - Corporation
Kotulak, Esq. Richard M.
Ramos-Feliciano Eliseo
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