4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Jaydeep Kumar Sinha

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Curvature-based edge bump quantification

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate

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Wafer edge-defect detection and capacitive probe therefor

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3221990

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