4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Jason Xu

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Adherent all-gold electrode structure for lithium niobate...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Correlation of electrical test data with physical defect data

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2852648

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