4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Jan Van Olmen

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Dual damascene patterning method

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method for measuring electromigration-induced resistance changes

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
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Profile ID: LFUS-PAI-P-1768881

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