4. Electrical transmission or interconnection systems
  5. Nonlinear reactor systems
  6. Parametrons

Jan B. Wilstrup

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AC parametric circuit having adjustable delay lock loop

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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Analysis of noise in repetitive waveforms

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Analysis of noise in repetitive waveforms

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Integrated circuit test power supply

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and apparatus for jitter analysis

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-605792

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