Integrated circuit test power supply

Details Integrated circuit test power supply Integrated circuit test power supply

1995-09-29

1998-06-30

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 1512

Patent

active

057739900

ABSTRACT:
A power supply for testing an integrated circuit includes a source voltage input terminal for receiving an input voltage. The power supply serves as both a DUT active power supply and an IDDQ measurement circuit, without the need for switching between separate DUT active power supply and IDDQ measurement circuits. In one embodiment, a current source output driver includes a diode across a current sensing resistor inside a feedback loop. This minimizes VDD changes when the DUT demands transient current, such as when loading IDDQ test vectors. Moreover, with decreased transient changes in VDD, dielectric absorption effects of a decoupling capacitor are reduced.

REFERENCES:
patent: 3617881 (1971-11-01), McCormick
patent: 5059889 (1991-10-01), Heaton
patent: 5481551 (1996-01-01), Nakano et al.
patent: 5514976 (1996-05-01), Ohmura

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