4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

James Vernon Rhodes

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Electromechanical module, for holding IC-chips in a chip...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Electronic system for testing a set of multiple chips...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Electronic system for testing chips having a selectable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Initial stage of a multi-stage algorithmic pattern generator...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Intermediate stage of a multi-stage algorithmic pattern...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2430888

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