Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-25
2005-10-25
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06958617
ABSTRACT:
An electromechanical module, for holding IC-chips in a chip testing system, includes a circuit board having a plurality of sockets mounted thereon. Each socket is structured to hold one IC-chip that is to be tested, and each socket has a corresponding register on the circuit board. In addition, a bus is on the circuit board, which—a) sends a timing pulse to a clock input on all of the registers in parallel, and b) concurrently sends a clock signal and N−1 test signals to N data inputs on all of the registers. Further, each socket has N input terminals that are connected to N outputs on a respective set of signal translators on the circuit board, and each set of signal translators has N inputs that are connected to N data outputs on the socket's corresponding register.
REFERENCES:
patent: 6356096 (2002-03-01), Takagi et al.
patent: 6833721 (2004-12-01), Park et al.
Carlson Robert Howard
Connacher Terry Sinclair
Ostrowski Carl Larry
Rhodes James Vernon
Fassbender Charles J.
Rode Lise A.
Starr Mark T.
Tang Minh N.
Unisys Corporation
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