4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

James D. Sansbury

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Apparatus and method for margin testing single polysilicon...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Apparatus and method for margin testing single polysilicon...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Apparatus and method for margin testing single polysilicon...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Biasing scheme for reducing stress and improving reliability in

Static information storage and retrieval – Floating gate – Particular biasing
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Compact electrically erasable memory cells and arrays

Static information storage and retrieval – Read/write circuit – Erase
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Profile ID: LFUS-PAI-P-741337

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