4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

J Kerveros

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Aligner and method for inspecting semiconductor wafer using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus and method for detection of foreign bodies in...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
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Apparatus and method for electrochemical corrosion monitoring

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Apparatus and method for performing built-in testing of a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – In an ignitor or detonator
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Apparatus for detecting a diaphragm failure

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-2029737

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