4. Semiconductor device manufacturing: process
  5. Having magnetic or ferroelectric component

Hyo Jin Nam

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Cantilever for scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Device for writing and reading data by using cantilever

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium
Reexamination Certificate

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Method for fabricating ferroelectric memory

Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2102369

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