4. Optics: measuring and testing
  5. Dimension
  6. Thickness

Hung Phi Nguyen

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Method of detecting the thickness of thin film disks or wafers

Optics: measuring and testing – Dimension – Thickness
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Wafer edge inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Wafer edge inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2839612

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