4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Huajun Wen

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Differential force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Dynamic phase splitter circuit and method for low-noise and...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Phase shift by less than period of input
Reexamination Certificate

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Edge triggered latch with symmetrical paths from clock to...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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Edge triggered latch with symmetrical paths from clock to...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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Edge-triggered latch with balanced pass-transistor logic...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific signal discriminating without subsequent control – By amplitude
Reexamination Certificate

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