4. Facsimile and static presentation processing
  5. Static presentation processing
  6. Size, resolution, or scale control

Hooman Honary

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Allocation of combined or separate data and control planes

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Allocation of combined or separate data and control planes

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Allocation of combined or separate data and control planes

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Apparatus and methods for forward error correction decoding

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Constraints-directed compilation for heterogeneous...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Profile ID: LFUS-PAI-P-2048136

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