4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. With sample excitation

Hongyan Li

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Forensic light using semiconductor light source

Surgery: light – thermal – and electrical application – Light – thermal – and electrical application – Light application
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Method for detecting forensic evidence

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
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Method for detecting forensic evidence

Illumination – Light source and modifier – With ventilating – cooling or heat insulating means
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Semiconductor forensic light kit

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
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Profile ID: LFUS-PAI-P-2876982

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