Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2007-10-16
2007-10-16
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
C362S294000
Reexamination Certificate
active
11112731
ABSTRACT:
A semiconductor forensic light kit is disclosed. The forensic light kit may use a variety of semiconductor light sources to produce light that contrasts forensic evidence against its background for viewing, photographing and collection. Example semiconductor light sources for the forensic light kit include light emitting diodes and laser chips. A heat sink, thermoelectric cooler and fan may be included to keep the forensic light cool. Removable light source heads may be included on the forensic light kit to provide for head swapping to give the user access to different wavelengths of light.
REFERENCES:
patent: 5072338 (1991-12-01), Hug et al.
patent: 5515162 (1996-05-01), Vezard et al.
patent: 5581356 (1996-12-01), Vezard
patent: 5613752 (1997-03-01), Vezard
patent: 6719559 (2004-04-01), Cao
patent: 6755649 (2004-06-01), Cao
patent: 6862093 (2005-03-01), Peng et al.
patent: 6890175 (2005-05-01), Fischer et al.
patent: 7098469 (2006-08-01), Carrington
patent: 2005/0254237 (2005-11-01), Nath et al.
Cao Densen
Li Hongyan
Lin Zhaohui
Ostler Calvin D.
CAO Group, Inc
Dobbin Geoffrey E.
Skovholt Jonathan
Toatley , Jr. Gregory J.
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