Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2005-10-11
2005-10-11
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
C362S294000, C362S234000, C250S459100, C250S461200
Reexamination Certificate
active
06954270
ABSTRACT:
A semiconductor forensic light is disclosed. The forensic light may use a variety of semiconductor light sources to produce light that contrasts forensic evidence against its background for viewing, photographing and collection. Example semiconductor light sources for the forensic light include light emitting diodes and laser chips. A heat sink, thermoelectric cooler and fan may be included to keep the forensic light cool. A removable light source head may be included on the forensic light to provide for head swapping to give the user access to different wavelengths of light.
REFERENCES:
patent: 4176205 (1979-11-01), Molina
patent: 5515162 (1996-05-01), Vezard et al.
patent: 5581356 (1996-12-01), Vezard
patent: 6124138 (2000-09-01), Woudenberg et al.
patent: 6126899 (2000-10-01), Woudenberg et al.
patent: RE37136 (2001-04-01), Vezard
patent: 6355439 (2002-03-01), Chung et al.
patent: 6485981 (2002-11-01), Fernandez
patent: 6719559 (2004-04-01), Cao
patent: 6755649 (2004-06-01), Cao
patent: 6890175 (2005-05-01), Fischer et al.
Cao Densen
Li Hongyan
Lin Zhaohui
Ostler Calvin D.
Cao Group, Inc.
Lauchman Layla G.
McCarthy Daniel P.
Parsons Behle & Latimer
LandOfFree
Method for detecting forensic evidence does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for detecting forensic evidence, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for detecting forensic evidence will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3483675