4. Electrical computers and digital processing systems: multicomput
  5. Computer-to-computer direct memory accessing

Hoffman Warnick

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Correlating macro and error data for debugging program error...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Determining history state of data based on state of...

Static information storage and retrieval – Read/write circuit – Testing
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Increasing electromigration lifetime and current density in...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Mechanical stress characterization in semiconductor device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Method of forming a vertical P-N junction device

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...
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