Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Inventor
active
Apparatus and method for compensating position of camera...
Apparatus to inspect TFT substrate and method of inspecting...
Inspection apparatus for thin film transistor substrate
Inspection apparatus for thin film transistor substrate
Panel inspection apparatus
No associations
LandOfFree
Ho-seok Choi does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Ho-seok Choi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ho-seok Choi will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2361100