4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. Specified electrical sensor or system

Ho Joon Park

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Capacitance z-axis accelerometer

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Reexamination Certificate

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Differential capacitive type MEMS sensor apparatus with...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

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Light emitting diode package and fabrication method thereof

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal
Reexamination Certificate

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Light emitting diode package and fabrication method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With housing or contact structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2815522

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