4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Housing or package

Hitoshi Izuru

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Burn-in system, burn-in control technique, and semiconductor...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor device testing method and testing equipment

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor integrated circuit device and test method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2391281

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