Semiconductor device testing method and testing equipment

Details Semiconductor device testing method and testing equipment Semiconductor device testing method and testing equipment

2007-04-03

2007-04-03

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11078352

ABSTRACT:
A burn-in testing method to perform tests with a semiconductor device operated in an atmosphere at a prescribed temperature characterized in that operation instruction signals instructing an operation of the semiconductor device are repeatedly supplied while supplying power to the semiconductor device, and increases and decreases in a power supply current corresponding to the operation instruction signals are counted.

REFERENCES:
patent: 5760599 (1998-06-01), Ehiro
patent: 6246248 (2001-06-01), Yamagishi
patent: 7-5231 (1995-01-01), None
patent: 7-174816 (1995-07-01), None
patent: 11-142471 (1999-05-01), None
patent: 2000-174081 (2000-06-01), None

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