4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital data error correction

Hiroyuki Tanikawa

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Non-volatile memory device with plurality of threshold...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Nonvolatile memory and semiconductor device with controlled...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Nonvolatile semiconductor memory device employing...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Nonvolatile semiconductor memory, data deletion method of...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1926948

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