Hiroshi Hatada

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Semiconductor device provided with a boundary-scan test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device using standard cell system

Patent

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Semiconductor device with test circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1451381

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