4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Hiroshi Fukiage

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Semiconductor integrated circuit and method for testing memory

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Semiconductor integrated circuit and method of checking memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Test system and manufacturing of semiconductor device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Test system and manufacturing of semiconductor device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2086175

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