4. Electricity: measuring and testing
  5. Measuring, testing, or sensing electricity, per se
  6. With rotor

Hiroki Hosaka

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Apparatus and method for testing semiconductor device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Centering mechanism, centering unit, semiconductor...

Material or article handling – Article reorienting device – Article reoriented while fully supported by stationary...
Reexamination Certificate

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Conveyance method for transporting objects

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Pair of stage arms for a semiconductor wafer delivery apparatus

Equipment for production – distribution – or transformation of ene – Distribution – modification or control – Semiconductor – transistor or integrated circuit
Design Patent

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Semiconductor wafer delivery apparatus

Equipment for production – distribution – or transformation of ene – Distribution – modification or control – Semiconductor – transistor or integrated circuit
Design Patent

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Profile ID: LFUS-PAI-P-470808

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